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Dielectric spectroscopy study of thermally-aged extruded model power cables

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conference contribution
posted on 2012-01-13, 13:36 authored by Tong Liu, John C. Fothergill, Stephen J. Dodd, Len A. Dissado, Ulf H. Nilsson, Mingli Fu, Fabrice Perrot
“Model” extruded power cables, having a much reduced geometry but using the same extrusion techniques and materials as full-sized cables, have been examined using dielectric spectroscopy techniques to study their thermal ageing effects. Cables insulated with homo-polymer XLPE and co-polymer of XLPE with micron-sized ethylene-butyl-acrylate (EBA) islands were studied by both frequency-domain and time-domain dielectric spectroscopy techniques after accelerated thermal ageing under 135°C for 60 days. In the frequency domain, a frequency response analyzer (FRA) was used to measure the frequency range from 10-4Hz to 1Hz at temperatures from 20°C to 80°C. In the time domain, a special charging/discharging current measurement system was developed to measure the frequencies from 10-1Hz to 102Hz. These techniques were chosen to cope with the extremely low dielectric losses of the model cables. The results are compared with those from new model power cables that were degassed at 80°C for 5 days. Thermal ageing was found to increase the low-frequency conductivity, permittivity and the discharging current. Both homo- and co-polymer cables have substantial increase of dielectric loss after ageing.

History

Citation

Proceedings of the 10th IEEE International Conference on Solid Dielectrics (ICSD), 2010, pp. 16-19

Author affiliation

/Organisation/COLLEGE OF SCIENCE AND ENGINEERING/Department of Engineering

Source

10th IEEE International Conference on Solid Dielectrics (ICSD), Postdam, Germany

Version

  • AM (Accepted Manuscript)

Published in

Proceedings of the 10th IEEE International Conference on Solid Dielectrics (ICSD)

Publisher

IEEE

issn

978-1-4244-7943-6 (Online)

isbn

978-1-4244-7945-0 (Print)

Copyright date

2010

Available date

2012-01-13

Publisher version

http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?asf_arn=null&asf_iid=null&asf_pun=5559271&asf_in=null&asf_rpp=null&asf_iv=null&asf_sp=null&asf_pn=1

Temporal coverage: start date

2010-07-04

Language

en

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