posted on 2018-05-23, 12:49authored byYakun Ju, Lin Qi, Huiyu Zhou, Junyu Dong, Liang Lu
Recovering fine-scale surface shapes is a challenging task in computer vision. Multispectral
photometric stereo is one of the popular methods as it can handle non-rigid/moving objects and produces
per-pixel dense results. However, the colored images captured by practical multispectral photometric stereo
setups are aliased in RGB channels. Existing solutions require prior information to calibrate few points
and estimates whole surface normal by the calibration, while prior information is not always available and
accurate. Differing from previous solutions which require calibration or other prior information, we first
formulate the problem in a learning framework, which directly seeks the per-pixel mapping of the aliased
and spectrum-multiplexed pixel response to the anti-aliased and demultiplexed counterpart. In this paper, we
propose to use a novel deep neural networks framework as the “demultiplexer”. By using “demultiplexer”
and classic photometric stereo, our method can reconstruct a dense and accurate surface normal from a
single-frame colored image without any prior information nor extra information injected. We build an
imaging device to collect images of different materials under colored lights and white lights. We conducted
extensive experiments on our dataset and a public dataset. The results show that the proposed fully connected
network successfully demultiplexes the colorful image and produces satisfactory surface estimation.
Funding
This work was supported by the International Science & Technology Cooperation Program of China (ISTCP) (No. 2014DFA10410) and
National Natural Science Foundation of China (NSFC) (No.61501417, No.41576011). H. Zhou was supported by UK EPSRC under
Grants EP/N508664/1, EP/R007187/1 and EP/N011074/1, and Royal Society-Newton Advanced Fellowship under Grant NA160342.
History
Citation
IEEE Access, 2018, 6, pp. 30804 - 30818
Author affiliation
/Organisation/COLLEGE OF SCIENCE AND ENGINEERING/Department of Informatics
Version
AM (Accepted Manuscript)
Published in
IEEE Access
Publisher
Institute of Electrical and Electronics Engineers (IEEE)