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HR-EBSD analysis of in situ stable crack growth at the micron scale

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posted on 2024-02-09, 17:09 authored by Abdalrhaman Koko, Thorsten H Becker, Elsiddig Elmukashfi, Nicola M Pugno, Angus J Wilkinson, T James Marrow

Understanding the local fracture resistance of microstructural features, such as brittle inclusions, coatings, and interfaces, at the microscale is critical for microstructure-informed design of materials. In this study, a novel approach has been formulated to decompose the 

-integral evaluation of the elastic energy release rate to the three-dimensional stress intensity factors directly from experimental measurements of the elastic deformation gradient tensors of the crack field by in situ high (angular) resolution electron backscatter diffraction (HR-EBSD). An exemplar study is presented of a quasi-static crack, inclined to the observed surface, propagating on low index 

 planes in a (001) single crystal silicon wafer.

Funding

Henry Royce Institute (Grant ref EP/R010145/1)

DTP 2016-2017 University of Oxford

Engineering and Physical Sciences Research Council

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History

Author affiliation

School of Engineering, University of Leicester

Version

  • VoR (Version of Record)

Published in

Journal of the Mechanics and Physics of Solids

Volume

172

Pagination

105173

Publisher

Elsevier BV

issn

0022-5096

Copyright date

2022

Available date

2024-02-09

Language

en

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