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Narrow-band X-ray polarizing filters.

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posted on 2010-02-09, 15:48 authored by A. Martindale, N. P. Bannister, K. D. M. Harris, G. A. Solan, S. P. Collins, Y. Champouret, V. K. Muppidi, G. W. Fraser, Mervyn Roy
We review past and current attempts to measure X-ray polarization in celestial sources and describe research activity into a new family of materials which have been shown to exhibit linear dichroism at X-ray wavelengths. Such materials could add a polarimetry capability to the high energy resolution detectors proposed for future, high effective area, X-ray astrophysical observatories such as Constellation-X and XEUS. They have the potential to achieve useful minimum detectable polarization values for a number of sources in a sensible exposure time with XEUS.

History

Citation

Proceedings of SPIE, 2007, 6686, 66860X.

Published in

Proceedings of SPIE

Publisher

Society of Photo-optical Instrumentation Engineers (SPIE)

issn

0277-786X

Copyright date

2007

Available date

2010-02-09

Publisher version

http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=817257

Language

en

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