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Percolation model for electrical breakdown in insulating polymers

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journal contribution
posted on 2013-04-08, 13:27 authored by Kai Wu, Len A. Dissado, Tatsuki Okamoto
It is suggested that an electric field above a given value eliminates the barriers to the transport of trapped charge carriers so as to produce an extended state in the form of a percolation cluster, and that the consequent current multiplication results in electrical breakdown. This model provides an estimated value of intrinsic breakdown strength close to the actual value. By considering the interactions between trap barrier potentials, the effect of electrical aging can be explained in terms of an increase in trap density. Many phenomena, such as the effect of weak points and the change of breakdown strength with the content of co-monomers or additives, can also be explained using this model.

History

Citation

Applied Physics Letters, 2004, 85 (19), pp. 4454-4456 (3)

Author affiliation

/Organisation/COLLEGE OF SCIENCE AND ENGINEERING/Department of Engineering

Version

  • VoR (Version of Record)

Published in

Applied Physics Letters

Publisher

American Institute of Physics (AIP)

issn

0003-6951

eissn

1077-3118

Copyright date

2004

Available date

2013-04-08

Publisher version

http://apl.aip.org/resource/1/applab/v85/i19/p4454_s1

Language

en

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