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Reliability and performance enhancements for SSD RAID

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journal contribution
posted on 2016-11-22, 15:11 authored by Alistair A. McEwan, Muhammed Ziya Komsul
NAND based solid state storage devices are almost ubiquitously used in safety-critical embedded devices, and recent advances have demonstrated RAID architectures specific to solid state storage devices resulting in increased data reliability, with architectural enhancements to solve the age convergence problem. However, these techniques require devices to be taken off-line while components are replaced—consequently these devices are of limited use in hard real time systems. There are further real time issues in that the conventional architectures ignore other characteristics of solid state devices such as garbage collection and meta data management. In this paper we investigate techniques that support the replacement of aged devices in the array in such a way that we provide continuous system reliability. We also improve the performance overhead of the reconstruction process using a novel data migration policy. The techniques are implemented and tested in a trace-driven simulator, and results demonstrate that average I/O response time is improved by up to 39% with improvement by up to 45% in its standard deviation, overheads in terms of device replacement time are negligible, and read performance is improved by an average of 8%.

History

Citation

Microprocessors and Microsystems, 2016

Author affiliation

/Organisation/COLLEGE OF SCIENCE AND ENGINEERING/Department of Engineering

Version

  • AM (Accepted Manuscript)

Published in

Microprocessors and Microsystems

Publisher

Elsevier

issn

0141-9331

eissn

1872-9436

Acceptance date

2016-11-14

Available date

2017-11-18

Publisher version

http://www.sciencedirect.com/science/article/pii/S0141933116303635

Language

en

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