AM_sigma13.pdf (977.22 kB)
Silicon Σ13 501 grain boundary interface structure determined by bicrystal Bragg rod x-ray scattering
journal contribution
posted on 2013-06-17, 09:11 authored by Paul Bedford Howes, S. Rhead, Mervyn Roy, C.L. Nicklin, J.L. Rawle, C.A. NorrisThe atomic structure of the silicon Σ13(501) symmetric tilt grain boundary interface has been determined using Bragg rod x-ray scattering. In contrast to conventional structural studies of grain boundary structure using transmission electron microscopy this approach allows the non-destructive measurement of macroscopic samples. The interface was found to have a single structure that is fully four-fold coordinated. X-ray diffraction data were measured at Beamline I07 at the Diamond Light Source.
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Citation
Acta Materialia, in pressAuthor affiliation
/Organisation/COLLEGE OF SCIENCE AND ENGINEERING/Department of Physics and AstronomyVersion
- AM (Accepted Manuscript)
Published in
Acta MaterialiaPublisher
Elsevier Ltdissn
1359-6454Copyright date
2013Available date
2015-07-05Publisher version
http://www.sciencedirect.com/science/journal/13596454Notes
The file associated with this record is embargoed until 24 months after the date of publication. The final published version may be available through the links above.Language
enAdministrator link
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