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Statistical behavior of electrical breakdown in insulating polymers

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journal contribution
posted on 2010-04-07, 13:20 authored by Kai Wu, Yang Wang, Yonghong Cheng, Len A. Dissado, Xiaojun Liu
A simulation model to investigate the statistical property of electrical breakdown is presented based on the field-assisted percolation model for dielectric breakdown, by expressing the disorder in morphology as randomly distributed trap barriers. The effects of sample area and large defects on the statistical property of breakdown are also studied, and the statistical behavior of the lifetime is investigated by considering the stochastic development of deteriorated regions. In addition an equation describing the breakdown probability in homogeneous materials is derived from percolation theory, which we show fits well to the simulation data. The breakdown probability is expressed in terms of trap distribution, and thus provides a way to connect the disorder in polymer morphology with the stochastic nature of breakdown.

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Citation

Journal of Applied Physics, 2010, 107, 064107.

Version

  • VoR (Version of Record)

Published in

Journal of Applied Physics

Publisher

American Institute of Physics

issn

0021-8979

eissn

1089-7550

Copyright date

2010

Available date

2010-04-07

Publisher version

http://scitation.aip.org/content/aip/journal/jap/107/6/10.1063/1.3342468

Language

en

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