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Surface morphology evolution of a polycrystalline diamond by inductively coupled plasma reactive ion etching (ICP-RIE)

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journal contribution
posted on 2019-07-08, 15:22 authored by Y Zheng, H Ye, J Liu, J Wei, L Chen, C Li
The needle-like surface morphology evolution in oxygen plasma in combination with a secondary gas (Cl2, CHF3 or CF4) by inductively coupled plasma reactive ion etching (ICP-RIE) on a free-standing polycrystalline diamond was investigated. The addition of CF4 can produce trans-polyacetylene (t-PA), which is similar to the result when the pure O2 etching takes place, and generate compact needle-tip particles. However, the t-PA disappears with the introduction of Cl or H ions. The optimised etching parameters for the needle-like structure formation are as following: Cl2/O2 ratio 20% and RF-power (RFP) 100 W, where more compact and even nano-needles are realised with an average etching rate of 2 μm/min. The Cl2/O2 plasma etching results indicate that the time-dependent etching mechanism of diamond nano-needles results from (1 1 1) crystal plane selective etching and preferential graphitisation at the twin-plane boundary and dislocation area.

Funding

This work was supported by the National Key Research and Development Program of China (no. 2016YFE0133200) and the European Union’s Horizon-2020 Research program (no. 734578). Special thanks to the national high-level university-sponsored graduate program of China Scholarship Council (CSC).

History

Citation

Materials Letters, 2019, 253, pp. 276-280

Author affiliation

/Organisation/COLLEGE OF SCIENCE AND ENGINEERING/Department of Engineering

Version

  • AM (Accepted Manuscript)

Published in

Materials Letters

Publisher

Elsevier

issn

0167-577X

eissn

1873-4979

Acceptance date

2019-06-25

Copyright date

2019

Publisher version

https://www.sciencedirect.com/science/article/pii/S0167577X19309498?via=ihub

Notes

The file associated with this record is under embargo until 12 months after publication, in accordance with the publisher's self-archiving policy. The full text may be available through the publisher links provided above.

Language

en

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